Facilities >>Scanning Electron Microscope(SEM)
Scanning Electron Microscope(SEM)
Model: Hitachi S-3500N
Specifications:
Resolution(SE image): 3.0 nm(30KV), 10 nm (3KV)
Resolution(BSE image): 4.0 nm(30KV)
Model: Hitachi S-3500N
Magnification: 5-300 000